FT/IR-8X is our flagship FTIR spectrometer, which has excellent signal-to-noise ratio (55,000:1) and high resolution (0.07 cm-1). FT/IR- 8X can be used with options for rapid scan measurement and step scan measurement with nanosecond time resolution (up to 10 nsec.). In addition, measurement wavenumber region can be extended as option, and it is possible to upgrade FT/IR-8X to vacuum model.

Reflection Absorption Spectroscopy has the benefit of greater sensitivity – up to 1 or 2 orders of magnitude compared with transmission. When parallel polarized light is incident to a metal surface, the electric vectors in the incident and reflected light interfere to mutually strengthen and form a vertical standing wave. The interaction of this stationary wave with a thin film on the metal surface, causes an absorption that is stronger than simple transmission measurement.

Used with a temperature controlled circulating water bath (not supplied) to maintain a constant sample and reference cell temperature.