Model

FP-8350

Light Source

Continuous output Xe arc lamp with shielded lamp housing (150 W)

Light Source (for validation)

Integrated, selectable low pressure mercury lamp

Photometric System

Ratio-photometer system using monochromatic light to monitor the intensity output of the Xe lamp

Monochromator

Holographic concave grating in modified Rowland mount

Ex Wavelength Range (with Standard Detector)

Zero order, 200 - 750 nm

Em Wavelength Range (with Standard Detector)

Zero order, 200 - 750 nm

Ex Wavelength Range (Optional)

200 – 900 nm

Em Wavelength Range (Optional)

200 – 900 nm

Sensitivity (RMS)

8,000:1

Ex Resolution

1.0 nm (at 546.1 nm)

Em Resolution

1.0 nm (at 546.1 nm)

Ex Band Width

1, 2.5, 5, 10, 20 nm

Em Band Width

1, 2.5, 5, 10, 20 nm

Ex Wavelength Accuracy

±1.5 nm

Em Wavelength Accuracy

±1.5 nm

Wavelength Repeatability

±1.0 nm

Ex Wavelength Scan Speed

20, 50, 100, 200, 500, 1,000, 2,000, 5,000, 10,000, 20,000 nm/min

Em Wavelength Scan Speed

20, 50, 100, 200, 500, 1,000, 2,000, 5,000, 10,000, 20,000 nm/min

Response

10, 20, 50, 100, 200, 500 msec, 1, 2, 4, 8 sec

Detector

Ex: Silicon photodiode, Em: PMT

Photometric Range

-10,000 - 10,000

Sensitivity Selection

High, Medium, Low, Very Low, Manual, Auto SCS

Auto Gain

Standard

Shutter Function

Standard (Automatic control)

Sample Illuminating System

Horizontal illumination

Sample Compartment

10 mm rectangular cell holder, nitrogen purgeable

Recognition of IQ Accessory

Standard

Start Button

Standard

Instrument Communication

USB 2.0

Control and Data Processing

Spectra Manager™ Ver.2.5/CFR

Spectral Correction tool

Option